The complexity of MIMOⁱ designs, driven by the new LTEⁱ standards, is further increased as MIMO systems scale up to 8x8 configurations. Moreover, other requirements such as beamforming and carrier aggregation drive the need for test solutions that provide deep insight within these multiple domains. Engineers who design and test advanced base stations, handsets and chipsets are looking for integrated solutions to model, implement and characterize their design. This presentation will review how the new standards will impact base station design methodologies and highlight some measurement challenges driven by the emergence and deployment of 8x8 MIMO.